Lab. de Calidad Superficial (micro y nanometrología)

Centro Español de Metrología

General information

Department
Área de Longitud
Acronym
CEM
Address
Alfar, 2
Postal Code
28760 - Tres Cantos
City
Contact
CARCEDO, Laura
Position
Email
lcarcedo@cem.minetur.es
Alt. email
Website
http://www.cem.es/

Organization profile

Year Established
Employees
ORCID
ResearchGate
Google Scholar

Main research areas

Nanofabrication, Nanometrology, SPM

Main research and technological activities

Patents and technology transfer

Active Patents
Patents Filed During Last 5 Years
Licensing Agreements
Spin-offs Created

Services offered

Available instruments and equipment

Equipment Name Model Manufacturer Year Open Access
Frequency Comb for generating and determining absolute frequencies with uncertainty of 10-14 (in VI and NIR). No
Metrological large range SPM for calibration of physical standards used in turn to calibrate other SPMs No
Microscopes: Interferometric, Digital Holographic, ... No
Device to calibrate piezoelectric actuators (by heterodyne interferometry and supressing of non linearities). No