Atomic Force Microscopy

Instituto de Ciencia de Materiales de Barcelona

General information

Department
Nanostructured materials
Acronym
CSIC
Address
Campus de la UAB, Bellaterra, Cerdanyola del Vallès
Postal Code
08193
City
Contact
OCAL GARCIA, Carmen
Position
Email
carmen.ocal@icmab.es
Alt. email
Website
http://www.icmab.es/

Organization profile

Year Established
Employees
ORCID
ResearchGate
Google Scholar

Main research areas

Nanoelectronics/Molecular electronics, Nanomaterials, SPM

Main research and technological activities

Patents and technology transfer

Active Patents
Patents Filed During Last 5 Years
Licensing Agreements
Spin-offs Created

Services offered

Available instruments and equipment

Equipment Name Model Manufacturer Year Open Access
Scanning Force Microscope No
Conductive- Scanning Force Microscope No
Organic deposition chambers (UHV) No
Joint Scaning Tunneling Microscopy and NC_AFM in Ultra High Vacuum No